The GM Series X-ray measurement systems are general purpose heavy duty production units especially designed for measuring the orientation of crystal products with respect to a selected crystallographic plane. Orientation processes of small to medium size crystals can be performed with the help of dedicated holders and jigs.

All single crystal can be processed, for all applications such as semi conductors, opto-electronics, optics, etc..

Orientation process of ingot flat.
Measurement of crystals with tilted planes.
Holder for seed orientation measurement.
Holder for wafer flat orientation measurement
DIGITAL  ANGLE DISPLAY
Display options
Decimal : resolution 0,01 - 0,001
Degrees, minutes, seconds : 1 or 5 sec.
PC & software : - standard or customized software.
                        - storage of mesured data.
All display versions enable reset to zero at any position. Absolutes or relative angle values can be alternatively displayed. Automatic recalibration.
 
RANGE OF OPERATIONS
Goniometer rotation range : -10° to 110°, with fast/ coarse and slow/fine rotation range.
Detector setting range : -10° to 110° with indexed positions (option)
 
PERFORMANCE
Measurement accuracy : +/- 0,005° to +/- 0,02° depending of crystal type, plane and surface condition.
With double diffraction : +/- 2 seconds to +/-15 seconds.
 
X-Ray generator
Output voltage : 30 kV-DC    Max. rating : 30mA
APPLICATIONS
Orientation measurements
Crystal face ( wafer, blank, block, bar...)
Ingot flat
Wafer flat and wafer notch
Seed axis of round or square seeds
 
Orientation processes
Flat orientation on medium size OD ground ingots.
Crystal face.
 
VERSIONS & CONFIGURATIONS
Capacities
For loads up to 10 kg and 25 kg
Special version for loads up to 100kg
Dual stations with mixed versions
 
Double diffraction option

GM Series 

X-Ray Goniometers

CRYSTAL PLANE ORIENTATION MEASUREMENTS

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